The circuit in figure 1 is a dynamic test for FETs. The characteristic of a FET is displayed in the virtual oscilloscope of the Multisim. The signal source is a 6 V x 100Hz signal applied to the gate of the transistor under test.
Figure 1 – Test circuit
The wave shape is displayed as shows figure 2. Observe the adjustments of the virtual oscilloscope. The sweep is adjusted for the A/B mode.
Figure 2 – Image in the virtual oscilloscope
To download the simulation files and Netlist - click here (msb0065.zip)
